Instytut Podstawowych Problemów Techniki
Polskiej Akademii Nauk

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Do Muoi


Ostatnie publikacje
1.  Le Thi Ngoc Bao, Nguyen T., Do Muoi, H.N.T. Phung, Le Van Tan, Negative electronic compressibility in MoS2 monolayers, PHYSICA B-CONDENSED MATTER, ISSN: 0921-4526, DOI: 10.1016/j.physb.2025.418022, Vol.720, pp.418022-1-10, 2026

Streszczenie:
The Coulomb-driven renormalization of electronic compressibility in monolayer MoS2 remains poorly understood at finite temperatures. Using the Rytova–Keldysh potential with a nonlocal dielectric response, we calculate the compressibility as a function of carrier density and temperature in experimentally relevant regimes. The exchange and correlation energies are treated, respectively, within the noninteracting (NI), Hartree–Fock (HF), and random phase approximation (RPA) frameworks. We demonstrate that the RPA, through enhanced screening induced by many-body correlations, yields negative values of the electronic compressibility,
in agreement with recent measurements resolved in temperature and density. At high temperatures (

Słowa kluczowe:
Graphene, Quantum well, TMDCs, Compressibility TMDCs, Capacity quantum

Afiliacje autorów:
Le Thi Ngoc Bao - inna afiliacja
Nguyen T. - IPPT PAN
Do Muoi - inna afiliacja
H.N.T. Phung - inna afiliacja
Le Van Tan - inna afiliacja
70p.

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