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Streszczenie:
This work aims to study a possible modification in the electronic structure of scandia-ceria-stabilized zirconia (10Sc1CeSZ) ceramics sintered at different temperatures. In addition to using X-ray diffraction (XRD), scanning electron microscopy (SEM) and impedance spectroscopy to investigate the structural and electrical properties, we employed X-ray photoelectron spectroscopy (XPS) to determine the chemical state information of the atoms involved, along with compositional analysis. As expected, a significant increase in grain ionic conductivity with the sintering temperature was present. This increase was accompanied by a decrease in the porosity of the samples, an increase in the grain size, and a transformation from the rhombohedral to the cubic phase. The phase transformation was detected not only using XRD, but also using XPS and, for this type of ceramic, XPS detected this transformation for the first time. In addition to the changes in the structural characteristics, the increase in the ionic conductivity was accompanied by a modification in the electronic structure of the ceramic surface. The XPS results showed that the surface of the ceramic sintered at the lower temperature of 1100 °C had a higher amount of Zr–OH bonds than the surface of the ceramic sintered at the higher temperature of 1400 °C. The existence of these Zr–OH bonds was confirmed using Fourier-transform infrared spectroscopy (FTIR). From this result, taken together with the difference between the oxygen/zirconium ratios in these ceramics, also identified using XPS, we conclude that there were fewer oxygen vacancies in the ceramic sintered at the lower temperature. It is argued that these two factors, together with the changes in the structural characteristics, have a direct influence on the conductive properties of the studied ceramics sintered at different temperatures.

Słowa kluczowe:
XPS, zirconia, scandia-ceria-stabilized zirconia, ScCSZ, SOFC

Streszczenie:
The purpose of this research is to design and construct a plasma radiation imaging system for fusion devices which is focused on soft X-ray region from about 2 to 15 keV photon energy. The proposed 2D diagnostic system, as opposed to conventional 1D systems, is expected to benefit from tangential field of view and to deliver new data for toroidal phenomena observations. This contribution relates to the introductory development of such 2D system laying out details on the overall design of the detecting unit (based on GEM technology) as well as on its acquisition module. The results cover also the expected photon flux and spectra foreseen for COMPASS-U device, as a first choice for testing and verification. Considerations on working medium and internal structure of the detecting sensor are presented including electrodes configurations and collecting electrode pattern. The preliminary establishments for data acquisition system are presented as well.

Słowa kluczowe:
Plasma physics, Plasma radiation diagnostics, SXR imaging detector, Micropattern gaseous detectors (MSGC; GEM; THGEM; RETHGEM; MHSP; MICROPIC, MICROMEGAS; InGrid; etc.), Gas electron multiplier, Detector simulations

Streszczenie:
Virgin and Yb-implanted epitaxial ZnO films grown using atomic layer deposition (ALD) were investigated by X-ray absorption spectroscopy (XAS). XAS study revealed a strong polarization dependence of films determined by the orientation of the polarization vector of the synchrotron radiation to the sample surface. It also indicated that the implantation and subsequent annealing have an important influence on the native point defect complexes in the ZnO. Comparison of experimental spectra with the modelled ones, which are computed based on the linear combination of model spectra corresponding to the selected point defects and their complexes, confirmed the presence of donor-acceptor complexes (mVZn - nVO, m = 1,4; n = 1,2) in the samples under study. The mechanism of vacancy complexes formation is unclear as it takes place under non-equilibrium conditions, for which any theoretical method has not been well established. Exploring the 3 d → 4 f absorption, it was found that oxidation state of Yb in ZnO is 3+, which is consistent with the XPS findings and previously conducted Resonant Photoemission Spectroscopy (RPES) investigations. The inversion of the polarization dependence for samples with different Yb fluences visible in Yb M5 spectra can be associated with a tilt of the oxygen pseudo octahedra or/and with their distortion. The analysis of the presented data suggests that the donor-acceptor complexes are present both in as grown and implanted films and may influence their electrical properties. This suggestion was confirmed by previous Hall measurements showing that the resistivity of annealed ZnO:Yb film with a fluence of 5e15 ions/cm2 decreases by about one order compared to the one with a fluence of 5e14 ions/cm2.

Streszczenie:
Creation and development of a new diagnostics useful for future thermonuclear reactors and helpful in studying impurity profiles, MHD modes/localization, and imaging are among urgent tasks in plasma research field. Global SXR imaging for DTT device in support of power exhaust programme and its consecutive impact for plasma core is an example of applicability of such diagnostics. This contribution presents the results of the ongoing development of the elaborated plasma X-ray imaging technology focusing on the design of the relevant structure of readout electrode. In order to achieve that, the details on the expected plasma radiation for the selected scenario for DTT machine were assessed. Then, the spatial distribution of plasma radiation intensity flux that will be reaching the detector window of the GEM based detector was simulated. Taking it into account along with the physical properties of the detector, the spatial and temporal distributions of charge cloud that will be reaching the readout plane were evaluated. The special design of the readout structure has been proposed that fulfil critical conditions originated from technological and physical constraints. The final effectiveness of the GEM based detector was evaluated proving that such detector is well suited for an effective plasma radiation imaging.

Słowa kluczowe:
X-ray detectors, GEM detector simulations, gas-electron multiplier (GEM) detector, SXR plasma imaging, DTT device

Streszczenie:
The structural, electronic, and magnetic properties of low-energy rhenium implanted c-Si are examined for the first time. The damage created by rhenium ions and the following partial reconstruction of the silicon host matrix after rapid thermal annealing (RTA) are investigated as a function of the fluence. Rutherford backscattering spectrometry (RBS) results reveal that the implanted ions are located in the near-surface region with the distribution maximum at about 23 nm below the surface. The analysis of rhenium-depth distribution using the McChasy code shows that the implanted Re-ions are located in the interstitial lattice positions. The RTA leads to a partial recovery of the silicon crystal structure. According to the RBS results, the formed inclusions are not coherent with the silicon host matrix causing an increase of the lattice distortion. Analysis of channeled RBS/c spectra carried out by the McChasy code revealed different levels of bent channels in damaged regions suggesting bimodal distribution of inclusions in the silicon. Studies of high-resolution X-ray photoelectron spectroscopy (XPS) conducted after the RTA showed the shift of Re 4f7/2 binding energy (BE) by +0.68 and + 0.85 eV with respect to metallic rhenium for the samples with lower/higher fluencies, respectively. Complex XPS, density functional theory (DFT) simulations, and transmission electron microscopy (TEM) data analysis allowed us to conclude that the near-surface layer of the sample (~10 nm) consists of nanoinclusions with cubic and/or hexagonal ReSi. In the middle area of the samples, much larger nanoinclusions (>10/20 nm for higher/lower fluencies, respectively) containing pure metallic rhenium inside are formed. The RTA increases the magnetic moment of the sample with the lower dose nearly 20-fold, whereas in the sample with the higher dose a 3-fold increment is observed only. The magnetic response of the examined systems after the RTA indicates a presence of magnetic interactions between the nanoinclusions resulting in the system exhibiting super-spin glass or super-ferromagnetism.

Słowa kluczowe:
rhenium-implanted silicon, RBS, XPS, RTA, TEM, DFT

Streszczenie:
After the problem of high-temperature plasma confinement, construction of diagnostics that is able to identify plasma contamination with impurities and to determine impurity distribution is another critically important issue. Solution of this problem would enable progress towards the success in controlled thermonuclear fusion. A new diagnostics, based on Gas Electron Multiplier (GEM) technology, has been recently developed for poloidal tomography focused on radiation of the metal impurities by monitoring in Soft X-Ray (SXR) region. GEM based detectors would undergo much less damage by neutrons than standard semiconductor diodes which results in better operational stability. This paper emphasizes the results of the latest examination of this type of detectors, showing influence of the charging-up effect on the detector performance and its physical properties for expected plasma radiation intensity. In addition, an undesired influence of aging of the detector window's material on the performance of the GEM detector is also shown: regular (moderate or active) usage could lead to changes of material's morphology as well as its composition. This study confirms the importance of further research into material’s optimization of GEM detectors used as a base for SXR tomographic diagnostics aimed to work under different plasma radiation conditions.

Słowa kluczowe:
nuclear instruments for hot plasma diagnostics, X-ray detectors, electron multipliers (gas), micropattern gaseous detectors, charging-up effect, detector window's material

Streszczenie:
Development of gaseous detectors, more specifically Gas Electron Multiplier (GEM) based detectors, for application at tokamak plasma radiation monitoring/imaging in Soft−Semi Hard X-ray (S−SH) region is an ongoing research activity aiming to deliver valuable information on plasma shape, magnetic configuration, non-axisymmetry phenomena of the plasma, etc. Wide radiation range and brightness of plasma radiation impose some restrictions on choice of materials in the detecting chamber, as their interaction with the incident radiation may disrupt original signals. This work proposes usage of aluminum as GEM foils electrodes for the first time. The detector based on these foils was constructed and examined. The operational characteristics and spectral capabilities of such detector were compared with the ones based on the standard (commonly used) copper GEM foils. The laboratory tests were performed using X-ray tube and 55Fe sources to examine detectors' capabilities in energy-resolved imaging. Additionally, simulations of origin and number of the generated electrons, which determine the detector signal, were performed for Al and Cu GEM foils for a wide energy range of incident photons. The experimental and modelling data demonstrated that Cu based GEM detector produces higher parasitic signal than Al one necessitating total elimination of copper from detector's chamber.

Słowa kluczowe:
nuclear instruments for hot plasma diagnostics, X-ray detectors, SXR imaging, electron multipliers (gas), micropattern gaseous detectors, aluminum GEM foils

Streszczenie:
X-ray photoelectron spectroscopy (XPS) studies of Au/Co/Au(0.3 nm)/MgO and Au/Co/MgO systems were conducted in order to monitor the electronic structure modification at Co/MgO interface with/without gold interlayer. A detailed analysis of Co 2p states revealed that the amount of minor oxygen contribution at Co/MgO interface decreased after the Au interlayer was added. The obtained XPS results together with density functional theory (DFT) allowed explanation of the increase of surface anisotropy energy in the sample with the gold interlayer in terms of (i) noble and transitional metal d-d orbital hybridization; (ii) interfacial Co 3d and O 2p; and (iii) interface imperfection.

Streszczenie:
A detecting system based on the Gas Electron Multiplier (GEM) technology is considered for tokamak plasma radiation monitoring. In order to estimate its capabilities in processing and recording intense photon flux (up to similar to 0.1 MHz/mm(2)), the imaging effectiveness of GEM detectors was tested with different patterned anode planes (i. e., different signal readouts): a simple hexagonal readout structure and three structures with interconnected electrodes (XY square, XY rectangular, and UXV). It was found that under intense photon flux, all the readouts fail to account for a considerable amount of the incoming signals due to mostly photon position determination ambiguity and overlapped signals. Analysis of the signals that can be used to determine photon position and energy unambiguously showed that the UXV readout structure is more effective among the readouts with interconnected electrodes. Along with similar spatial resolution and accuracy, the UXV based layout could be considered as a quite promising base of the interconnected anode electrodes configuration, keeping in mind that the photon rate capability has to be improved for the final application.

Streszczenie:
For the purpose of monitoring the level of plasma impurity (especially tungsten) and its distribution reconstruction at tokamaks (ITER in particular), a Soft X-Ray (SXR) tomographic diagnostics based on Gas Electron Multiplier (GEM) detectors with energy discrimination has been extensively considered for a while. Coupled with advanced electronics, GEM detectors offer excellent time and space resolution, as well as a charge spectrum from which the SXR photon spectrum can be deconvolved. In addition, they are less subjected to a neutron damage as compared to standard semiconductor diodes. This contribution highlights the latest studies supporting the development of such diagnostics focusing on laboratory tests to examine: (a) the impact of GEM holes geometry on the properties and distribution of the electron avalanche; (b) the effect of the high rate photon flux on GEM foil performance; and (c) the optimal electric field distribution.

Słowa kluczowe:
Nuclear instruments for hot plasma diagnostics, X-ray detectors, Electron multipliers (gas), Micropattern gaseous detectors (MSGC; GEM; THGEM; RETHGEM; MHSP; MICROPIC; MICROMEGAS; InGrid; etc.)