| 1. |
Kret S.♦, Bilska M.♦, Ivaldi F.♦, Leszczyński M.♦, Czernecki R.♦, Dłużewski P., Jurczak G., Young T.D., Determination of the nanoscale structural properties of the InAlN based devices by advanced TEM methods,
E-MRS 2012 FALL MEETING, 2012-09-17/09-21, Warszawa (PL), pp.1, 2012 Keywords:
III-V semiconductors, piezoelectricity, high resolution transmission electron microscopy, band edge structure Affiliations:
| Kret S. | - | Institute of Physics, Polish Academy of Sciences (PL) | | Bilska M. | - | other affiliation | | Ivaldi F. | - | other affiliation | | Leszczyński M. | - | other affiliation | | Czernecki R. | - | other affiliation | | Dłużewski P. | - | IPPT PAN | | Jurczak G. | - | IPPT PAN | | Young T.D. | - | IPPT PAN |
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